Huawei’s 2022 patent details novel technique to make 2-nm-class chips without EUV tool



Huawei Technologies’ three-year-old patent for advanced patterning comparable with 2-nanometre grade technology without extreme ultraviolet (EUV) lithography tools has intensified speculation about a potential breakthrough in advanced chips.

The US-sanctioned company is working to patent a metal integration technique for manufacturing semiconductors, which allows narrow metal structures to be integrated using deep ultraviolet (DUV) technology even for “metal pitches below 21nm”, a feature required for 2nm-class chips.

The proposed solution offered a technical pathway to support a 2-nm process using older DUV technology, aiming to bypass US sanctions that block China’s access to the most advanced EUV tools from Dutch firm ASML.

The patent, currently pending, was originally submitted by Huawei in June 2022 and made public by China’s national intellectual property regulator in January this year. There is no evidence that the patent has been put to use.

Amid growing talk of China’s tech breakthroughs, a Chinese chip industry veteran argued that 14-nm logic chips could rival the performance of Nvidia’s 4-nm chips through integration with advanced memory and novel architecture.

Huawei declined to comment on the patent.

  • Related Posts

    What does the new BIA mean for businesses and Indians? – Firstpost

    The India-Israel Bilateral Investment Agreement (BIA) officially came into force on Saturday (July 4, 2026). Signed in New Delhi on September 8 last year, the agreement replaces the nearly 30-year-old…

    Continue reading
    Mukesh Ambani, Sunil Bharti Mittal join global AI body to shape responsible AI – Firstpost

    Reliance Industries Chairman and Managing Director Mukesh Ambani has been named a founding member of the newly launched AI for Good Global Commission, joining an influential group of 44 global…

    Continue reading

    Leave a Reply

    Your email address will not be published. Required fields are marked *